雙擴散金屬氧化物半導體工藝
指定 | The prototype | Av (V/mV) Min | Battery Current, IBAT1 (max), nA | Battery Supply Voltage, VBAT | External Caps (mF) | Features | Application, features | Process Description | Frequency, kHz | FT, МHz | Functions: 12H/24H | Ucc ЖКИ,В | Uds, В | Ui max, В | Uo, В | Uref, В, (max) | Uref, В, (min) | U меж.баз., В (max) | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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Field N DMOS transistors | MOSFET Low-power Vtn= 0,6-3,0V Ubr=50-200V Pmax=1,0 Watt High-power Vtn= 2,0-4,0V Ubr=50-600V Pmax=200 Watt |
Number of masks, pcs. 7-9 Min design rule,µm 3.0 Substrate: Si/Sb-doped/ n-type/Res 0,01 Epi layer: Thickness (9÷42) µm Resistivity (0,7÷16) Ohm/cm Gate oxide (42,5÷80) nm Interlayer dielectric - medium temp. PSG Passivation: low temp. PSG |
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Power field MOS transistors, Umax= 60÷900 V, 150 mm wafers | MOSFET NMOS: Vtn=2÷4 V Umax= 60÷900 V |
Number of masks, pcs. 8 Min design rule,µm 2.0 Substrate: Si/Sb-doped/ n-type/Res 0,015; Si/ As-doped/ n-type/ Res 0,003 Epi layer: thickness 8÷75) µm Resistivity (0,67÷31,5) Ohm/cm Gate oxide (60÷100) nm Interlayer dielectric medium temp. oxide + BPSG Passivation PEoxide + PE SI3N4 |
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Field P DMOS transistors | UT54ACS164245 | 4 | 4 | 4 | 4 | 3 | Number of masks, pcs. 7-9 Min design rule,µm 3.0 Substrate: Si/B-doped/ p-type/Res 0,005 Epi layer: thickness (15-34) µm Resistivity (2÷21) Ohm/cm Gate oxide (42,5÷80) nm Interlayer dielectric medium temp. PSG Passivation: low temp. PSG |
2 | 1 | 1 | 23423 | 4324 | 324 | 32423 | 423 | 423 | 324 | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||